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U.S. solar Metrology thin film solar CIS, CIGS, CIGSSe and CdTe thickness measuring instrument
Features :
1. The only NIST can provide levels of standard samples, together with the U.S. NREL.
2. Large sample chamber, H: 56cmXW; 54cmXD74cm
3. Can be stored directly on the coating of the Protocol and the establishment of various parameters can be set more analysis to determine the process products
Quality.
Quality.
4. CIGS various coating materials for filters, a total of five kinds of
5. XYZ axis automatic positioning, bearing a distance of 8 "X8" X6 ", and has auto-focus Bian / Div>
6. Has a surface relative offset automatic adjustment system
7. Use of natural light, LED white light, no color
8. Using the latest high-tech electronics cooling with high sensitivity detectors
9. With anti-collision safety device
10. With the operation, radiation safety equipment
11. Can be established laboratory copy data directly to the online test on machine.
Basic Specifications :
| X-ray occurred Department | Voltage | Maximum 50kV, multi-voltage switching |
| Current | 4-1000
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